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Shun Ishiyama

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1989
2 Kazumi Hatayama, Mitsuji Ikeda, Terumine Hayashi, Masahiro Takakura, Kuniaki Kishida, Shun Ishiyama: Enhanced Delay Test Generator for High-Speed Logic LSIs. ITC 1989: 161-165
1986
1EEKuniaki Kishida, F. Shirotori, Y. Ikemoto, Shun Ishiyama, Terumine Hayashi: A delay test system for high speed logic LSI's. DAC 1986: 786-790

Coauthor Index

1Kazumi Hatayama [2]
2Terumine Hayashi [1] [2]
3Mitsuji Ikeda [2]
4Y. Ikemoto [1]
5Kuniaki Kishida [1] [2]
6F. Shirotori [1]
7Masahiro Takakura [2]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)