Junzhi Sang

2001
2	EE	Junzhi Sang, Tsuyoshi Shinogi, Haruhiko Takase, Hidehiko Kita, Terumine Hayashi: An enhanced fault model for high defect coverage. Systems and Computers in Japan 32(6): 36-44 (2001)
1998
1	EE	Junzhi Sang, Tsuyoshi Shinogi, Haruhiko Takase, Terumine Hayashi: On a Logical Fault Model H1SGLF for Enhancing Defect Coverage. Asian Test Symposium 1998: 102-107

Coauthor Index

1	Terumine Hayashi	[1] [2]
2	Hidehiko Kita	[2]
3	Tsuyoshi Shinogi	[1] [2]
4	Haruhiko Takase	[1] [2]