| |
| 2004 | ||
|---|---|---|
| 2 | EE | Stefan Dilhaire, Stéphane Grauby, Wilfrid Claeys, Jean-Christophe Batsale: Thermal parameters identification of micrometric layers of microelectronic devices by thermoreflectance microscopy. Microelectronics Journal 35(10): 811-816 (2004) |
| 1 | EE | Josep Altet, J. M. Rampnoux, Jean-Christophe Batsale, Stefan Dilhaire, Antonio Rubio, Wilfrid Claeys, Stéphane Grauby: Applications of temperature phase measurements to IC testing. Microelectronics Reliability 44(1): 95-103 (2004) |
| 1 | Josep Altet | [1] |
| 2 | Wilfrid Claeys | [1] [2] |
| 3 | Stefan Dilhaire | [1] [2] |
| 4 | Stéphane Grauby | [1] [2] |
| 5 | J. M. Rampnoux | [1] |
| 6 | Antonio Rubio | [1] |