2000 | ||
---|---|---|
2 | EE | Josep Altet, Antonio Rubio, E. Schaub, Stefan Dilhaire, Wilfrid Claeys: Thermal Testing: Fault Location Strategies. VTS 2000: 189-194 |
1999 | ||
1 | EE | Josep Altet, Antonio Rubio, Wilfrid Claeys, Stefan Dilhaire, E. Schaub, Hideo Tamamoto: Differential Thermal Testing: An Approach to its Feasibility. J. Electronic Testing 14(1-2): 57-66 (1999) |
1 | Josep Altet | [1] [2] |
2 | Wilfrid Claeys | [1] [2] |
3 | Stefan Dilhaire | [1] [2] |
4 | Antonio Rubio | [1] [2] |
5 | Hideo Tamamoto | [1] |