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E. Schaub

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2000
2EEJosep Altet, Antonio Rubio, E. Schaub, Stefan Dilhaire, Wilfrid Claeys: Thermal Testing: Fault Location Strategies. VTS 2000: 189-194
1999
1EEJosep Altet, Antonio Rubio, Wilfrid Claeys, Stefan Dilhaire, E. Schaub, Hideo Tamamoto: Differential Thermal Testing: An Approach to its Feasibility. J. Electronic Testing 14(1-2): 57-66 (1999)

Coauthor Index

1Josep Altet [1] [2]
2Wilfrid Claeys [1] [2]
3Stefan Dilhaire [1] [2]
4Antonio Rubio [1] [2]
5Hideo Tamamoto [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)