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M. Amine Salhi

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2006
5EEJ. M. Rampnoux, H. Michel, M. Amine Salhi, Stéphane Grauby, Wilfrid Claeys, Stefan Dilhaire: Time gating imaging through thick silicon substrate: a new step towards backside characterisation. Microelectronics Reliability 46(9-11): 1520-1524 (2006)
2005
4EEStéphane Grauby, M. Amine Salhi, Wilfrid Claeys, D. Trias, Stefan Dilhaire: ElectroStatic Discharge Fault Localization by Laser Probing. Microelectronics Reliability 45(9-11): 1482-1486 (2005)
2004
3EEJosep Altet, Antonio Rubio, M. Amine Salhi, J. L. Gálvez, Stefan Dilhaire, Ashish Syal, André Ivanov: Sensing temperature in CMOS circuits for Thermal Testing. VTS 2004: 179-184
2EELuis David Patiño Lopez, Stéphane Grauby, Stefan Dilhaire, M. Amine Salhi, Wilfrid Claeys, Stéphane Lefèvre, Sebastian Volz: Characterization of the thermal behavior of PN thermoelectric couples by scanning thermal microscope. Microelectronics Journal 35(10): 797-803 (2004)
2003
1EEStefan Dilhaire, M. Amine Salhi, Stéphane Grauby, Wilfrid Claeys: Laser Seebeck Effect Imaging (SEI) and Peltier Effect Imaging (PEI): complementary investigation methods. Microelectronics Reliability 43(9-11): 1609-1613 (2003)

Coauthor Index

1Josep Altet [3]
2Wilfrid Claeys [1] [2] [4] [5]
3Stefan Dilhaire [1] [2] [3] [4] [5]
4J. L. Gálvez [3]
5Stéphane Grauby [1] [2] [4] [5]
6André Ivanov [3]
7Stéphane Lefèvre [2]
8Luis David Patiño Lopez [2]
9H. Michel [5]
10J. M. Rampnoux [5]
11Antonio Rubio [3]
12Ashish Syal [3]
13D. Trias [4]
14Sebastian Volz [2]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)