2006 |
5 | EE | J. M. Rampnoux,
H. Michel,
M. Amine Salhi,
Stéphane Grauby,
Wilfrid Claeys,
Stefan Dilhaire:
Time gating imaging through thick silicon substrate: a new step towards backside characterisation.
Microelectronics Reliability 46(9-11): 1520-1524 (2006) |
2005 |
4 | EE | Stéphane Grauby,
M. Amine Salhi,
Wilfrid Claeys,
D. Trias,
Stefan Dilhaire:
ElectroStatic Discharge Fault Localization by Laser Probing.
Microelectronics Reliability 45(9-11): 1482-1486 (2005) |
2004 |
3 | EE | Josep Altet,
Antonio Rubio,
M. Amine Salhi,
J. L. Gálvez,
Stefan Dilhaire,
Ashish Syal,
André Ivanov:
Sensing temperature in CMOS circuits for Thermal Testing.
VTS 2004: 179-184 |
2 | EE | Luis David Patiño Lopez,
Stéphane Grauby,
Stefan Dilhaire,
M. Amine Salhi,
Wilfrid Claeys,
Stéphane Lefèvre,
Sebastian Volz:
Characterization of the thermal behavior of PN thermoelectric couples by scanning thermal microscope.
Microelectronics Journal 35(10): 797-803 (2004) |
2003 |
1 | EE | Stefan Dilhaire,
M. Amine Salhi,
Stéphane Grauby,
Wilfrid Claeys:
Laser Seebeck Effect Imaging (SEI) and Peltier Effect Imaging (PEI): complementary investigation methods.
Microelectronics Reliability 43(9-11): 1609-1613 (2003) |