2005 |
12 | EE | Takashi Yukawa,
Naoko Obara,
Hideo Tamamoto:
Automatic Construction of the Motion Database which Allows to Search Contents by a Motion Name.
MVA 2005: 534-537 |
11 | EE | Xiaoqing Wen,
Seiji Kajihara,
Hideo Tamamoto,
Kewal K. Saluja,
Kozo Kinoshita:
On Design for IDDQ-Based Diagnosability of CMOS Circuits Using Multiple Power Supplies.
IEICE Transactions 88-D(4): 703-710 (2005) |
10 | EE | Xiaoqing Wen,
Hideo Tamamoto,
Kewal K. Saluja,
Kozo Kinoshita:
Fault Diagnosis of Physical Defects Using Unknown Behavior Model.
J. Comput. Sci. Technol. 20(2): 187-194 (2005) |
2003 |
9 | EE | Xiaoqing Wen,
Hideo Tamamoto,
Kewal K. Saluja,
Kozo Kinoshita:
Fault Diagnosis for Physical Defects of Unknown Behaviors.
Asian Test Symposium 2003: 236-241 |
1999 |
8 | EE | Josep Altet,
Antonio Rubio,
Wilfrid Claeys,
Stefan Dilhaire,
E. Schaub,
Hideo Tamamoto:
Differential Thermal Testing: An Approach to its Feasibility.
J. Electronic Testing 14(1-2): 57-66 (1999) |
7 | EE | Hiroshi Yokoyama,
Xiaoqing Wen,
Hideo Tamamoto:
Random pattern testable design with partial circuit duplication and IDDQ testing.
Systems and Computers in Japan 30(5): 18-27 (1999) |
1998 |
6 | EE | Xiaoqing Wen,
Tooru Honzawa,
Hideo Tamamoto,
Kewal K. Saluja,
Kozo Kinoshita:
Design for Diagnosability of CMOS Circuits.
Asian Test Symposium 1998: 144-149 |
1997 |
5 | EE | Josep Altet,
Antonio Rubio,
Hideo Tamamoto:
Analysis of the Feasibility of Dynamic Thermal Testing in Digital Circuits.
Asian Test Symposium 1997: 149-154 |
4 | EE | Hiroshi Yokoyama,
Xiaoqing Wen,
Hideo Tamamoto:
Random Pattern Testable Design with Partial Circuit Duplication.
Asian Test Symposium 1997: 353-358 |
3 | EE | Xiaoqing Wen,
Hideo Tamamoto,
Kozo Kinoshita:
IDDQ test vector selection for transistor short fault testing.
Systems and Computers in Japan 28(5): 11-21 (1997) |
1995 |
2 | EE | Xiaoqing Wen,
Hideo Tamamoto,
Kozo Kinoshita:
Transistor leakage fault location with ZDDQ measurement.
Asian Test Symposium 1995: 51-57 |
1992 |
1 | EE | Hideo Tamamoto,
Yuichi Narita,
Akira Yanase,
Futoshi Saito,
Kazuto Komatsu:
A Measuring System for Traffic Flow of Passers-by by Processing ITV Image in Real Time.
MVA 1992: 343-348 |