| 2005 |
| 12 | EE | Takashi Yukawa,
Naoko Obara,
Hideo Tamamoto:
Automatic Construction of the Motion Database which Allows to Search Contents by a Motion Name.
MVA 2005: 534-537 |
| 11 | EE | Xiaoqing Wen,
Seiji Kajihara,
Hideo Tamamoto,
Kewal K. Saluja,
Kozo Kinoshita:
On Design for IDDQ-Based Diagnosability of CMOS Circuits Using Multiple Power Supplies.
IEICE Transactions 88-D(4): 703-710 (2005) |
| 10 | EE | Xiaoqing Wen,
Hideo Tamamoto,
Kewal K. Saluja,
Kozo Kinoshita:
Fault Diagnosis of Physical Defects Using Unknown Behavior Model.
J. Comput. Sci. Technol. 20(2): 187-194 (2005) |
| 2003 |
| 9 | EE | Xiaoqing Wen,
Hideo Tamamoto,
Kewal K. Saluja,
Kozo Kinoshita:
Fault Diagnosis for Physical Defects of Unknown Behaviors.
Asian Test Symposium 2003: 236-241 |
| 1999 |
| 8 | EE | Josep Altet,
Antonio Rubio,
Wilfrid Claeys,
Stefan Dilhaire,
E. Schaub,
Hideo Tamamoto:
Differential Thermal Testing: An Approach to its Feasibility.
J. Electronic Testing 14(1-2): 57-66 (1999) |
| 7 | EE | Hiroshi Yokoyama,
Xiaoqing Wen,
Hideo Tamamoto:
Random pattern testable design with partial circuit duplication and IDDQ testing.
Systems and Computers in Japan 30(5): 18-27 (1999) |
| 1998 |
| 6 | EE | Xiaoqing Wen,
Tooru Honzawa,
Hideo Tamamoto,
Kewal K. Saluja,
Kozo Kinoshita:
Design for Diagnosability of CMOS Circuits.
Asian Test Symposium 1998: 144-149 |
| 1997 |
| 5 | EE | Josep Altet,
Antonio Rubio,
Hideo Tamamoto:
Analysis of the Feasibility of Dynamic Thermal Testing in Digital Circuits.
Asian Test Symposium 1997: 149-154 |
| 4 | EE | Hiroshi Yokoyama,
Xiaoqing Wen,
Hideo Tamamoto:
Random Pattern Testable Design with Partial Circuit Duplication.
Asian Test Symposium 1997: 353-358 |
| 3 | EE | Xiaoqing Wen,
Hideo Tamamoto,
Kozo Kinoshita:
IDDQ test vector selection for transistor short fault testing.
Systems and Computers in Japan 28(5): 11-21 (1997) |
| 1995 |
| 2 | EE | Xiaoqing Wen,
Hideo Tamamoto,
Kozo Kinoshita:
Transistor leakage fault location with ZDDQ measurement.
Asian Test Symposium 1995: 51-57 |
| 1992 |
| 1 | EE | Hideo Tamamoto,
Yuichi Narita,
Akira Yanase,
Futoshi Saito,
Kazuto Komatsu:
A Measuring System for Traffic Flow of Passers-by by Processing ITV Image in Real Time.
MVA 1992: 343-348 |