| |
| 1995 | ||
|---|---|---|
| 3 | EE | Shujian Zhang, Rod Byrne, Jon C. Muzio, D. Michael Miller: Quantitative analysis for linear hybrid cellular automata and LFSR as built-in self-test generators for sequential faults. J. Electronic Testing 7(3): 209-221 (1995) |
| 1994 | ||
| 2 | Shujian Zhang, Rod Byrne, Jon C. Muzio, D. Michael Miller: Why Cellular Automata are better than LFSRs as Built-in Self-test Generators for Sequential-type Faults. ISCAS 1994: 69-72 | |
| 1992 | ||
| 1 | Shujian Zhang, Rod Byrne, D. Michael Miller: BIST Generators for Sequential Faults. ICCD 1992: 260-263 | |
| 1 | D. Michael Miller | [1] [2] [3] |
| 2 | Jon C. Muzio | [2] [3] |
| 3 | Shujian Zhang | [1] [2] [3] |