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Rod Byrne

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1995
3EEShujian Zhang, Rod Byrne, Jon C. Muzio, D. Michael Miller: Quantitative analysis for linear hybrid cellular automata and LFSR as built-in self-test generators for sequential faults. J. Electronic Testing 7(3): 209-221 (1995)
1994
2 Shujian Zhang, Rod Byrne, Jon C. Muzio, D. Michael Miller: Why Cellular Automata are better than LFSRs as Built-in Self-test Generators for Sequential-type Faults. ISCAS 1994: 69-72
1992
1 Shujian Zhang, Rod Byrne, D. Michael Miller: BIST Generators for Sequential Faults. ICCD 1992: 260-263

Coauthor Index

1D. Michael Miller [1] [2] [3]
2Jon C. Muzio [2] [3]
3Shujian Zhang [1] [2] [3]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)