| |
| 2004 | ||
|---|---|---|
| 1 | EE | Bram Kruseman, Ananta K. Majhi, Camelia Hora, Stefan Eichenberger, Johan Meirlevede: Systematic Defects in Deep Sub-Micron Technologies. ITC 2004: 290-299 |
| 1 | Stefan Eichenberger | [1] |
| 2 | Camelia Hora | [1] |
| 3 | Bram Kruseman | [1] |
| 4 | Ananta K. Majhi | [1] |