Stephen W. Director

2005
43	EE	Ashish Srivastava, Saumil Shah, Kanak Agarwal, Dennis Sylvester, David Blaauw, Stephen W. Director: Accurate and efficient gate-level parametric yield estimation considering correlated variations in leakage power and performance. DAC 2005: 535-540
2001
42	EE	Juan Antonio Carballo, Stephen W. Director: Application of Constraint-Based Heuristics in Collaborative Design. DAC 2001: 395-400
2000
41	EE	Jingyan Zuo, Stephen W. Director: An Integrated Design Environment for Early Stage Conceptual Design. DATE 2000: 754
1999
40	EE	Juan Antonio Carballo, Stephen W. Director: Constraint Management for Collaborative Electronic Design. DAC 1999: 529-534
1998
39	EE	Peter R. Sutton, Stephen W. Director: Framework Encapsulations: A New Approach to CAD Tool Interoperability. DAC 1998: 134-139
1996
38	EE	Peter R. Sutton, Stephen W. Director: A Description Language for Design Process Management. DAC 1996: 175-180
37	EE	John W. Hagerman, Stephen W. Director: Improved Tool and Data Selection in Task Management. DAC 1996: 181-184
36	EE	Margarida F. Jacome, Stephen W. Director: A formal basis for design process planning and management. IEEE Trans. on CAD of Integrated Circuits and Systems 15(10): 1197-1210 (1996)
1995
35	EE	Kannan Krishna, Stephen W. Director: A novel methodology for statistical parameter extraction. ICCAD 1995: 696-699
34	EE	Jay B. Brockman, Stephen W. Director: The schema-based approach to workflow management. IEEE Trans. on CAD of Integrated Circuits and Systems 14(10): 1257-1267 (1995)
33	EE	Kannan Krishna, Stephen W. Director: The linearized performance penalty (LPP) method for optimization of parametric yield and its reliability. IEEE Trans. on CAD of Integrated Circuits and Systems 14(12): 1557-1568 (1995)
1994
32	EE	Vladimir Koval, Igor W. Farmaga, Andrzej J. Strojwas, Stephen W. Director: MONSTR: A Complete Thermal Simulator of Electronic Systems. DAC 1994: 570-575
31		Zhihua Wang, Stephen W. Director: An Efficient Yield Optimization Method Using A Two Step Linear Approximation of Circuit Performance. EDAC-ETC-EUROASIC 1994: 567-571
30	EE	Margarida F. Jacome, Stephen W. Director: A formal basis for design process planning and management. ICCAD 1994: 516-521
1993
29	EE	Peter R. Sutton, Jay B. Brockman, Stephen W. Director: Design Management Using Dynamically Defined Flows. DAC 1993: 648-653
28	EE	Peter Feldmann, Stephen W. Director: Integrated circuit quality optimization using surface integrals. IEEE Trans. on CAD of Integrated Circuits and Systems 12(12): 1868-1879 (1993)
1992
27	EE	Margarida F. Jacome, Stephen W. Director: Design Process Management for CAD Frameworks. DAC 1992: 500-505
26		Jay B. Brockman, Stephen W. Director: A Schema-Based Approach to CAD Task Management. Electronic Design Automation Frameworks 1992: 71-84
25	EE	Stephen W. Director, Jonathan Allen, J. Duley: Engineering education: trends and needs (panel). ICCAD 1992: 456
1991
24		Peter Feldmann, Stephen W. Director: Improved Methods for IC Yield and Quality Optimization Using Surface Integrals. ICCAD 1991: 158-161
23		Jay B. Brockman, Stephen W. Director: The Hercules CAD Task Management System. ICCAD 1991: 254-257
22	EE	Peter Feldmann, Tuyen V. Nguyen, Stephen W. Director, Ronald A. Rohrer: Sensitivity computation in piecewise approximate circuit simulation. IEEE Trans. on CAD of Integrated Circuits and Systems 10(2): 171-183 (1991)
21	EE	James Daniell, Stephen W. Director: An object oriented approach to CAD tool control [VLSI]. IEEE Trans. on CAD of Integrated Circuits and Systems 10(6): 698-713 (1991)
20	EE	K. K. Low, Stephen W. Director: A new methodology for the design centering of IC fabrication processes. IEEE Trans. on CAD of Integrated Circuits and Systems 10(7): 895-903 (1991)
19	EE	Andrzej J. Strojwas, Stephen W. Director: An efficient algorithm for parametric fault simulation of monolithic IC's. IEEE Trans. on CAD of Integrated Circuits and Systems 10(8): 1049-1058 (1991)
1990
18		Peter Feldmann, Stephen W. Director: Accurate and Efficient Evaluation of Circuit Yield and Yield Gradients. ICCAD 1990: 120-123
1989
17	EE	M. T. Trick, Stephen W. Director: LASSIE: Structure to Layout for Behavioral Synthesis Tools. DAC 1989: 104-109
16	EE	James Daniell, Stephen W. Director: An Object Oriented Approach to CAD Tool Control within a Design Framework. DAC 1989: 197-202
15	EE	K. K. Low, Stephen W. Director: An efficient methodology for building macromodels of IC fabrication processes. IEEE Trans. on CAD of Integrated Circuits and Systems 8(12): 1299-1313 (1989)
14	EE	Michael L. Bushnell, Stephen W. Director: Automated design tool execution in the Ulysses design environment. IEEE Trans. on CAD of Integrated Circuits and Systems 8(3): 279-287 (1989)
1987
13	EE	Michael L. Bushnell, Stephen W. Director: ULYSSES - a knowledge-based VLSI design environment. AI in Engineering 2(1): 33-41 (1987)
1986
12	EE	Luís M. Vidigal, Sani R. Nassif, Stephen W. Director: CINNAMON: coupled integration and nodal analysis of MOS networks. DAC 1986: 179-185
11	EE	Michael L. Bushnell, Stephen W. Director: VLSI CAD tool integration using the Ulysses environment. DAC 1986: 55-61
10	EE	Sani R. Nassif, Andrzej J. Strojwas, Stephen W. Director: A Methodology for Worst-Case Analysis of Integrated Circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 5(1): 104-113 (1986)
9	EE	Wojciech Maly, Andrzej J. Strojwas, Stephen W. Director: VLSI Yield Prediction and Estimation: A Unified Framework. IEEE Trans. on CAD of Integrated Circuits and Systems 5(1): 114-130 (1986)
8	EE	Costas J. Spanos, Stephen W. Director: Parameter Extraction for Statistical IC Process Characterization. IEEE Trans. on CAD of Integrated Circuits and Systems 5(1): 66-78 (1986)
7	EE	David P. La Potin, Stephen W. Director: Mason: A Global Floorplanning Approach for VLSI Design. IEEE Trans. on CAD of Integrated Circuits and Systems 5(4): 477-489 (1986)
6	EE	D. M. H. Walker, Stephen W. Director: VLASIC: A Catastrophic Fault Yield Simulator for Integrated Circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 5(4): 541-556 (1986)
1985
5	EE	Tariq Samad, Stephen W. Director: Towards a natural language interface for CAD. DAC 1985: 2-8
4	EE	Andrzej J. Strojwas, Stephen W. Director: A Pattern Recognition Based Method for IC Failure Analysis. IEEE Trans. on CAD of Integrated Circuits and Systems 4(1): 76-92 (1985)
3	EE	Karem A. Sakallah, Stephen W. Director: SAMSON2: An Event Driven VLSI Circuit Simulator. IEEE Trans. on CAD of Integrated Circuits and Systems 4(4): 668-684 (1985)
1984
2	EE	Sani R. Nassif, Andrzej J. Strojwas, Stephen W. Director: FABRICS II: A Statistically Based IC Fabrication Process Simulator. IEEE Trans. on CAD of Integrated Circuits and Systems 3(1): 40-46 (1984)
1982
1	EE	Luís M. Vidigal, Stephen W. Director: A Design Centering Algorithm for Nonconvex Regions of Acceptability. IEEE Trans. on CAD of Integrated Circuits and Systems 1(1): 13-24 (1982)

Coauthor Index

1	Kanak Agarwal	[43]
2	Jonathan Allen	[25]
3	David Blaauw (David T. Blaauw)	[43]
4	Jay B. Brockman	[23] [26] [29] [34]
5	Michael L. Bushnell	[11] [13] [14]
6	Juan Antonio Carballo	[40] [42]
7	James Daniell	[16] [21]
8	J. Duley	[25]
9	Igor W. Farmaga	[32]
10	Peter Feldmann	[18] [22] [24] [28]
11	John W. Hagerman	[37]
12	Margarida F. Jacome	[27] [30] [36]
13	Vladimir Koval	[32]
14	Kannan Krishna	[33] [35]
15	K. K. Low	[15] [20]
16	Wojciech Maly	[9]
17	Sani R. Nassif	[2] [10] [12]
18	Tuyen V. Nguyen	[22]
19	David P. La Potin	[7]
20	Ronald A. Rohrer	[22]
21	Karem A. Sakallah	[3]
22	Tariq Samad	[5]
23	Saumil Shah	[43]
24	Costas J. Spanos	[8]
25	Ashish Srivastava	[43]
26	Andrzej J. Strojwas	[2] [4] [9] [10] [19] [32]
27	Peter R. Sutton	[29] [38] [39]
28	Dennis Sylvester	[43]
29	M. T. Trick	[17]
30	Luís M. Vidigal	[1] [12]
31	D. M. H. Walker (Duncan M. Hank Walker)	[6]
32	Zhihua Wang	[31]
33	Jingyan Zuo	[41]

Colors in the list of coauthors