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| 1995 | ||
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| 2 | EE | Kannan Krishna, Stephen W. Director: A novel methodology for statistical parameter extraction. ICCAD 1995: 696-699 |
| 1 | EE | Kannan Krishna, Stephen W. Director: The linearized performance penalty (LPP) method for optimization of parametric yield and its reliability. IEEE Trans. on CAD of Integrated Circuits and Systems 14(12): 1557-1568 (1995) |
| 1 | Stephen W. Director | [1] [2] |