2007 | ||
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18 | EE | Takeshi Kumaki, Tetsushi Koide, Hans Jürgen Mattausch, Yasuto Kuroda, Hideyuki Noda, Katsumi Dosaka, Kazutami Arimoto, Kazunori Saito: Efficient Vertical/Horizontal-Space 1D-DCT Processing Based on Massive-Parallel Matrix-Processing Engine. ISCAS 2007: 525-528 |
17 | EE | Hirokatsu Shirahama, Akira Mochizuki, Takahiro Hanyu, Masami Nakajima, Kazutami Arimoto: Design of a Processing Element Based on Quaternary Differential Logic for a Multi-Core SIMD Processor. ISMVL 2007: 43 |
16 | EE | Hiroki Shimano, Fukashi Morishita, Katsumi Dosaka, Kazutami Arimoto: A Voltage Scalable Advanced DFM RAM with Accelerated Screening for Low Power SoC Platform. IEICE Transactions 90-C(10): 1927-1935 (2007) |
15 | EE | Kazutami Arimoto, Toshihiro Hattori, Hidehiro Takata, Atsushi Hasegawa, Toru Shimizu: Continuous Design Efforts for Ubiquitous Network Era under the Physical Limitation of Advanced CMOS. IEICE Transactions 90-C(4): 657-665 (2007) |
14 | EE | Fukashi Morishita, Hideyuki Noda, Isamu Hayashi, Takayuki Gyohten, Mako Okamoto, Takashi Ipposhi, Shigeto Maegawa, Katsumi Dosaka, Kazutami Arimoto: A Capacitorless Twin-Transistor Random Access Memory (TTRAM) on SOI. IEICE Transactions 90-C(4): 765-771 (2007) |
13 | EE | Takeshi Kumaki, Yasuto Kuroda, Masakatsu Ishizaki, Tetsushi Koide, Hans Jürgen Mattausch, Hideyuki Noda, Katsumi Dosaka, Kazutami Arimoto, Kazunori Saito: Real-Time Huffman Encoder with Pipelined CAM-Based Data Path and Code-Word-Table Optimizer. IEICE Transactions 90-D(1): 334-345 (2007) |
12 | EE | Takeshi Kumaki, Masakatsu Ishizaki, Tetsushi Koide, Hans Jürgen Mattausch, Yasuto Kuroda, Hideyuki Noda, Katsumi Dosaka, Kazutami Arimoto, Kazunori Saito: Acceleration of DCT Processing with Massive-Parallel Memory-Embedded SIMD Matrix Processor. IEICE Transactions 90-D(8): 1312-1315 (2007) |
2006 | ||
11 | EE | Takayuki Gyohten, Fukashi Morishita, Isamu Hayashi, Mako Okamoto, Hideyuki Noda, Katsumi Dosaka, Kazutami Arimoto, Yasutaka Horiba: An On-Chip Supply-Voltage Control System Considering PVT Variations for Worst-Caseless Lower Voltage SoC Design. IEICE Transactions 89-C(11): 1519-1525 (2006) |
10 | EE | Hideyuki Noda, Katsumi Dosaka, Hans Jürgen Mattausch, Tetsushi Koide, Fukashi Morishita, Kazutami Arimoto: A Reliability-Enhanced TCAM Architecture with Associated Embedded DRAM and ECC. IEICE Transactions 89-C(11): 1612-1619 (2006) |
2005 | ||
9 | EE | Takeshi Kumaki, Yasuto Kuroda, Tetsushi Koide, Hans Jürgen Mattausch, Hideyuki Noda, Katsumi Dosaka, Kazutami Arimoto, Kazunori Saito: CAM-based VLSI architecture for Huffman coding with real-time optimization of the code word table [image coding example]. ISCAS (5) 2005: 5202-5205 |
8 | EE | Akira Yamazaki, Fukashi Morishita, Naoya Watanabe, Teruhiko Amano, Masaru Haraguchi, Hideyuki Noda, Atsushi Hachisuka, Katsumi Dosaka, Kazutami Arimoto, Setsuo Wake, Hideyuki Ozaki, Tsutomu Yoshihara: A Study of Sense-Voltage Margins in Low-Voltage-Operating Embedded DRAM Macros. IEICE Transactions 88-C(10): 2020-2027 (2005) |
7 | EE | Hideyuki Noda, Kazunari Inoue, Hans Jürgen Mattausch, Tetsushi Koide, Katsumi Dosaka, Kazutami Arimoto, Kazuyasu Fujishima, Kenji Anami, Tsutomu Yoshihara: Embedded Low-Power Dynamic TCAM Architecture with Transparently Scheduled Refresh. IEICE Transactions 88-C(4): 622-629 (2005) |
6 | EE | Kazunari Inoue, Hideyuki Noda, Kazutami Arimoto, Hans Jürgen Mattausch, Tetsushi Koide: A CAM-Based Signature-Matching Co-processor with Application-Driven Power-Reduction Features. IEICE Transactions 88-C(6): 1332-1342 (2005) |
2001 | ||
5 | Yoshihiro Nagura, Michael Mullins, Anthony Sauvageau, Yoshinoro Fujiwara, Katsuya Furue, Ryuji Ohmura, Tatsunori Komoike, Takenori Okitaka, Tetsushi Tanizaki, Katsumi Dosaka, Kazutami Arimoto, Yukiyoshi Koda, Tetsuo Tada: Test cost reduction by at-speed BISR for embedded DRAMs. ITC 2001: 182-187 | |
1993 | ||
4 | EE | Masaki Tsukude, Kazutami Arimoto, Hideto Hidaka, Yasuhiro Konishi, Masanori Hayashikoshi, Katsuhiro Suma, Kazuyasu Fujishima: Highly Reliable Testing of ULSI Memories with On-Chip Voltage-Down Converters. IEEE Design & Test of Computers 10(2): 6-12 (1993) |
1992 | ||
3 | Masaki Tsukude, Kazutami Arimoto, Hideto Hidaka, Yasuhiro Konishi, Masanori Hayashikishi, Katsunori Suma, Kazuyasu Fujishima: A Testing Technique for ULSI Memory with On-Chip Voltage Down Converter. ITC 1992: 615-622 | |
1989 | ||
2 | Yoshio Matsuda, Kazutami Arimoto, Masaki Tsukude, Tsukasa Oishi, Kazuyasu Fujishima: A New Array Architecture for Parallel Testing in VLSI Memories. ITC 1989: 322-326 | |
1985 | ||
1 | Hiroshi Miyamoto, Koichiro Mashiko, Yoshikazu Morooka, Kazutami Arimoto, Michihiro Yamada, T. Nakano: Test Pattern Considerations for Fault Tolerant High Density DRAM. ITC 1985: 451-455 |