Masaki Tsukude

1993
3	EE	Masaki Tsukude, Kazutami Arimoto, Hideto Hidaka, Yasuhiro Konishi, Masanori Hayashikoshi, Katsuhiro Suma, Kazuyasu Fujishima: Highly Reliable Testing of ULSI Memories with On-Chip Voltage-Down Converters. IEEE Design & Test of Computers 10(2): 6-12 (1993)
1992
2		Masaki Tsukude, Kazutami Arimoto, Hideto Hidaka, Yasuhiro Konishi, Masanori Hayashikishi, Katsunori Suma, Kazuyasu Fujishima: A Testing Technique for ULSI Memory with On-Chip Voltage Down Converter. ITC 1992: 615-622
1989
1		Yoshio Matsuda, Kazutami Arimoto, Masaki Tsukude, Tsukasa Oishi, Kazuyasu Fujishima: A New Array Architecture for Parallel Testing in VLSI Memories. ITC 1989: 322-326

Coauthor Index

1	Kazutami Arimoto	[1] [2] [3]
2	Kazuyasu Fujishima	[1] [2] [3]
3	Masanori Hayashikishi	[2]
4	Masanori Hayashikoshi	[3]
5	Hideto Hidaka	[2] [3]
6	Yasuhiro Konishi	[2] [3]
7	Yoshio Matsuda	[1]
8	Tsukasa Oishi	[1]
9	Katsuhiro Suma	[3]
10	Katsunori Suma	[2]