2005 |
4 | EE | Hideyuki Noda,
Kazunari Inoue,
Hans Jürgen Mattausch,
Tetsushi Koide,
Katsumi Dosaka,
Kazutami Arimoto,
Kazuyasu Fujishima,
Kenji Anami,
Tsutomu Yoshihara:
Embedded Low-Power Dynamic TCAM Architecture with Transparently Scheduled Refresh.
IEICE Transactions 88-C(4): 622-629 (2005) |
1993 |
3 | EE | Masaki Tsukude,
Kazutami Arimoto,
Hideto Hidaka,
Yasuhiro Konishi,
Masanori Hayashikoshi,
Katsuhiro Suma,
Kazuyasu Fujishima:
Highly Reliable Testing of ULSI Memories with On-Chip Voltage-Down Converters.
IEEE Design & Test of Computers 10(2): 6-12 (1993) |
1992 |
2 | | Masaki Tsukude,
Kazutami Arimoto,
Hideto Hidaka,
Yasuhiro Konishi,
Masanori Hayashikishi,
Katsunori Suma,
Kazuyasu Fujishima:
A Testing Technique for ULSI Memory with On-Chip Voltage Down Converter.
ITC 1992: 615-622 |
1989 |
1 | | Yoshio Matsuda,
Kazutami Arimoto,
Masaki Tsukude,
Tsukasa Oishi,
Kazuyasu Fujishima:
A New Array Architecture for Parallel Testing in VLSI Memories.
ITC 1989: 322-326 |