| |
| 1992 | ||
|---|---|---|
| 1 | Masaki Tsukude, Kazutami Arimoto, Hideto Hidaka, Yasuhiro Konishi, Masanori Hayashikishi, Katsunori Suma, Kazuyasu Fujishima: A Testing Technique for ULSI Memory with On-Chip Voltage Down Converter. ITC 1992: 615-622 | |
| 1 | Kazutami Arimoto | [1] |
| 2 | Kazuyasu Fujishima | [1] |
| 3 | Masanori Hayashikishi | [1] |
| 4 | Hideto Hidaka | [1] |
| 5 | Yasuhiro Konishi | [1] |
| 6 | Masaki Tsukude | [1] |