2005 | ||
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1 | EE | Akira Yamazaki, Fukashi Morishita, Naoya Watanabe, Teruhiko Amano, Masaru Haraguchi, Hideyuki Noda, Atsushi Hachisuka, Katsumi Dosaka, Kazutami Arimoto, Setsuo Wake, Hideyuki Ozaki, Tsutomu Yoshihara: A Study of Sense-Voltage Margins in Low-Voltage-Operating Embedded DRAM Macros. IEICE Transactions 88-C(10): 2020-2027 (2005) |
1 | Teruhiko Amano | [1] |
2 | Kazutami Arimoto | [1] |
3 | Katsumi Dosaka | [1] |
4 | Atsushi Hachisuka | [1] |
5 | Masaru Haraguchi | [1] |
6 | Fukashi Morishita | [1] |
7 | Hideyuki Noda | [1] |
8 | Setsuo Wake | [1] |
9 | Naoya Watanabe | [1] |
10 | Akira Yamazaki | [1] |
11 | Tsutomu Yoshihara | [1] |