| 2002 |
|---|
| 4 | EE | Shigeki Tomishima,
Hiroaki Tanizaki,
Mitsutaka Niiro,
Masanao Maruta,
Hideto Hidaka,
T. Tada,
Kenji Gamo:
A Variable Drivability (VD) Output Buffer for the System In a Package (SIP) and High Frequency Wafer Test.
ITC 2002: 170-177 |
| 2000 |
|---|
| 3 | | Tomoya Kawagoe,
Jun Ohtani,
Mitsutaka Niiro,
Tukasa Ooishi,
Mitsuhiro Hamada,
Hideto Hidaka:
A built-in self-repair analyzer (CRESTA) for embedded DRAMs.
ITC 2000: 567-574 |
| 1993 |
|---|
| 2 | EE | Masaki Tsukude,
Kazutami Arimoto,
Hideto Hidaka,
Yasuhiro Konishi,
Masanori Hayashikoshi,
Katsuhiro Suma,
Kazuyasu Fujishima:
Highly Reliable Testing of ULSI Memories with On-Chip Voltage-Down Converters.
IEEE Design & Test of Computers 10(2): 6-12 (1993) |
| 1992 |
|---|
| 1 | | Masaki Tsukude,
Kazutami Arimoto,
Hideto Hidaka,
Yasuhiro Konishi,
Masanori Hayashikishi,
Katsunori Suma,
Kazuyasu Fujishima:
A Testing Technique for ULSI Memory with On-Chip Voltage Down Converter.
ITC 1992: 615-622 |
