| |
| 1993 | ||
|---|---|---|
| 1 | EE | Masaki Tsukude, Kazutami Arimoto, Hideto Hidaka, Yasuhiro Konishi, Masanori Hayashikoshi, Katsuhiro Suma, Kazuyasu Fujishima: Highly Reliable Testing of ULSI Memories with On-Chip Voltage-Down Converters. IEEE Design & Test of Computers 10(2): 6-12 (1993) |
| 1 | Kazutami Arimoto | [1] |
| 2 | Kazuyasu Fujishima | [1] |
| 3 | Masanori Hayashikoshi | [1] |
| 4 | Hideto Hidaka | [1] |
| 5 | Yasuhiro Konishi | [1] |
| 6 | Masaki Tsukude | [1] |