| |
| 1985 | ||
|---|---|---|
| 1 | Hiroshi Miyamoto, Koichiro Mashiko, Yoshikazu Morooka, Kazutami Arimoto, Michihiro Yamada, T. Nakano: Test Pattern Considerations for Fault Tolerant High Density DRAM. ITC 1985: 451-455 | |
| 1 | Kazutami Arimoto | [1] |
| 2 | Koichiro Mashiko | [1] |
| 3 | Hiroshi Miyamoto | [1] |
| 4 | Yoshikazu Morooka | [1] |
| 5 | Michihiro Yamada | [1] |