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2001 | ||
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1 | Yoshihiro Nagura, Michael Mullins, Anthony Sauvageau, Yoshinoro Fujiwara, Katsuya Furue, Ryuji Ohmura, Tatsunori Komoike, Takenori Okitaka, Tetsushi Tanizaki, Katsumi Dosaka, Kazutami Arimoto, Yukiyoshi Koda, Tetsuo Tada: Test cost reduction by at-speed BISR for embedded DRAMs. ITC 2001: 182-187 |
1 | Kazutami Arimoto | [1] |
2 | Katsumi Dosaka | [1] |
3 | Yoshinoro Fujiwara | [1] |
4 | Katsuya Furue | [1] |
5 | Yukiyoshi Koda | [1] |
6 | Tatsunori Komoike | [1] |
7 | Michael Mullins | [1] |
8 | Yoshihiro Nagura | [1] |
9 | Takenori Okitaka | [1] |
10 | Anthony Sauvageau | [1] |
11 | Tetsuo Tada | [1] |
12 | Tetsushi Tanizaki | [1] |