Ryuji Ohmura

2001
1		Yoshihiro Nagura, Michael Mullins, Anthony Sauvageau, Yoshinoro Fujiwara, Katsuya Furue, Ryuji Ohmura, Tatsunori Komoike, Takenori Okitaka, Tetsushi Tanizaki, Katsumi Dosaka, Kazutami Arimoto, Yukiyoshi Koda, Tetsuo Tada: Test cost reduction by at-speed BISR for embedded DRAMs. ITC 2001: 182-187

Coauthor Index

1	Kazutami Arimoto	[1]
2	Katsumi Dosaka	[1]
3	Yoshinoro Fujiwara	[1]
4	Katsuya Furue	[1]
5	Yukiyoshi Koda	[1]
6	Tatsunori Komoike	[1]
7	Michael Mullins	[1]
8	Yoshihiro Nagura	[1]
9	Takenori Okitaka	[1]
10	Anthony Sauvageau	[1]
11	Tetsuo Tada	[1]
12	Tetsushi Tanizaki	[1]