1988 |
10 | EE | Zeev Barzilai,
Daniel K. Beece,
Leendert M. Huisman,
Vijay S. Iyengar,
Gabriel M. Silberman:
SLS-a fast switch-level simulator [for MOS].
IEEE Trans. on CAD of Integrated Circuits and Systems 7(8): 838-849 (1988) |
1987 |
9 | EE | Zeev Barzilai,
J. Lawrence Carter,
Barry K. Rosen,
Joe D. Rutledge:
HSS--A High-Speed Simulator.
IEEE Trans. on CAD of Integrated Circuits and Systems 6(4): 601-617 (1987) |
1986 |
8 | EE | Zeev Barzilai,
Daniel K. Beece,
Leendert M. Huisman,
Vijay S. Iyengar,
Gabriel M. Silberman:
SLS - a fast switch level simulator for verification and fault coverage analysis.
DAC 1986: 164-170 |
7 | | Zeev Barzilai,
J. Lawrence Carter,
Vijay S. Iyengar,
Indira Nair,
Barry K. Rosen,
Joe D. Rutledge,
Gabriel M. Silberman:
Efficient Fault Simulation of CMOS Circuits with Accurate Models.
ITC 1986: 520-529 |
1985 |
6 | | Zeev Barzilai,
Vijay S. Iyengar,
Barry K. Rosen,
Gabriel M. Silberman:
Accurate Fault Modeling and Efficient Simulation of Differential CVS Circuits.
ITC 1985: 722-731 |
1984 |
5 | | Zeev Barzilai,
Daniel K. Beece,
Leendert M. Huisman,
Gabriel M. Silberman:
Using a Hardware Simulation Engine for Custom MOS Structured Designs.
IBM Journal of Research and Development 28(5): 564-571 (1984) |
1983 |
4 | | Zeev Barzilai,
Barry K. Rosen:
Comparison of AC Self-Testing Procedures.
ITC 1983: 89-94 |
3 | | Zeev Barzilai,
Don Coppersmith,
Arnold L. Rosenberg:
Exhaustive Generation of Bit Patterns with Applications to VLSI Self-Testing.
IEEE Trans. Computers 32(2): 190-194 (1983) |
1981 |
2 | | Zeev Barzilai,
Jacob Savir,
George Markowsky,
Merlin G. Smith:
VLSI Self-Testing Based on Syndrome Techniques.
ITC 1981: 102-109 |
1 | | Zeev Barzilai,
Jacob Savir,
George Markowsky,
Merlin G. Smith:
The Weighted Syndrome Sums Approach to VLSI Testing.
IEEE Trans. Computers 30(12): 996-1000 (1981) |