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C. Sie

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1981
1 Robert G. Dunn, A. Kwan, David P. Rodgers, D. Sandstrom, C. Sie: System to Optimize Test Quality and Efficiency for Memories and LSI. ITC 1981: 31-37

Coauthor Index

1Robert G. Dunn [1]
2A. Kwan [1]
3David P. Rodgers [1]
4D. Sandstrom [1]

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