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Masato Kawai

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1988
6 Hidetoshi Tanaka, Masato Kawai, Izumi Sugasaki, Tadanobu Hakuba: System Level Fault Dictionary Generation. ITC 1988: 884-887
1986
5 T. Noguchi, Atsushi Murakami, Masato Kawai, Y. Hayasaka: Testing for a Solid-State Color Image Sensor. ITC 1986: 683-687
4 Masato Kawai, T. Shimono, S. Funatsu: Test Data Quality Assurance. ITC 1986: 848-852
1985
3 T. Shimono, K. Oozeki, M. Takahashi, Masato Kawai, S. Funatsu: An AC/DC Test Generation System for Gate Array LSIs. ITC 1985: 329-333
1983
2 Masato Kawai, H. Shibano, S. Funatsu, S. Kato, T. Kurobe, K. Ookawa, T. Sasaki: A High Level Test Pattern Generation Algorithm. ITC 1983: 346-353
1981
1 Shigeru Takasaki, Masato Kawai, S. Funatsu, Akihiko Yamoda: A Calculus of Testability Measure at the Functional Level. ITC 1981: 95-101

Coauthor Index

1S. Funatsu [1] [2] [3] [4]
2Tadanobu Hakuba [6]
3Y. Hayasaka [5]
4S. Kato [2]
5T. Kurobe [2]
6Atsushi Murakami [5]
7T. Noguchi [5]
8K. Ookawa [2]
9K. Oozeki [3]
10T. Sasaki [2]
11H. Shibano [2]
12T. Shimono [3] [4]
13Izumi Sugasaki [6]
14M. Takahashi [3]
15Shigeru Takasaki [1]
16Hidetoshi Tanaka [6]
17Akihiko Yamoda [1]

Colors in the list of coauthors

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)