| 1988 |
|---|
| 6 | | Hidetoshi Tanaka,
Masato Kawai,
Izumi Sugasaki,
Tadanobu Hakuba:
System Level Fault Dictionary Generation.
ITC 1988: 884-887 |
| 1986 |
|---|
| 5 | | T. Noguchi,
Atsushi Murakami,
Masato Kawai,
Y. Hayasaka:
Testing for a Solid-State Color Image Sensor.
ITC 1986: 683-687 |
| 4 | | Masato Kawai,
T. Shimono,
S. Funatsu:
Test Data Quality Assurance.
ITC 1986: 848-852 |
| 1985 |
|---|
| 3 | | T. Shimono,
K. Oozeki,
M. Takahashi,
Masato Kawai,
S. Funatsu:
An AC/DC Test Generation System for Gate Array LSIs.
ITC 1985: 329-333 |
| 1983 |
|---|
| 2 | | Masato Kawai,
H. Shibano,
S. Funatsu,
S. Kato,
T. Kurobe,
K. Ookawa,
T. Sasaki:
A High Level Test Pattern Generation Algorithm.
ITC 1983: 346-353 |
| 1981 |
|---|
| 1 | | Shigeru Takasaki,
Masato Kawai,
S. Funatsu,
Akihiko Yamoda:
A Calculus of Testability Measure at the Functional Level.
ITC 1981: 95-101 |
