| |
| 1983 | ||
|---|---|---|
| 2 | Shigeru Sugamori, Kunio Takeuchi, Hiromi Maruyama, Shinpei Kamata: High-Fidelity Device Tester Interface. ITC 1983: 371-378 | |
| 1981 | ||
| 1 | Shigeru Sugamori, Kenji Yoshida, Hiromi Maruyama, Shinpei Kamata, Tsuneta Sudo: Analysis and Definition of Overall Timing Accuracy in VLSI Test System. ITC 1981: 143-153 | |
| 1 | Shinpei Kamata | [1] [2] |
| 2 | Hiromi Maruyama | [1] [2] |
| 3 | Tsuneta Sudo | [1] |
| 4 | Kunio Takeuchi | [2] |
| 5 | Kenji Yoshida | [1] |