A. Kwan
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1981
1
Robert G. Dunn
, A. Kwan,
David P. Rodgers
,
D. Sandstrom
,
C. Sie
: System to Optimize Test Quality and Efficiency for Memories and LSI.
ITC 1981
: 31-37
Coauthor
Index
1
Robert G. Dunn
[
1
]
2
David P. Rodgers
[
1
]
3
D. Sandstrom
[
1
]
4
C. Sie
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
