| |
| 2004 | ||
|---|---|---|
| 1 | EE | Xiaoqing Wen, Tokiharu Miyoshi, Seiji Kajihara, Laung-Terng Wang, Kewal K. Saluja, Kozo Kinoshita: On per-test fault diagnosis using the X-fault model. ICCAD 2004: 633-640 |
| 1 | Seiji Kajihara | [1] |
| 2 | Kozo Kinoshita | [1] |
| 3 | Kewal K. Saluja | [1] |
| 4 | Laung-Terng Wang | [1] |
| 5 | Xiaoqing Wen | [1] |