| 2004 |
|---|
| 6 | | Rafic A. Ayoubi,
Haissam Ziade,
Magdy A. Bayoumi:
Hopfield associative memory on mesh.
ISCAS (5) 2004: 800-803 |
| 5 | EE | Haissam Ziade,
Rafic A. Ayoubi,
Raoul Velazco:
A Survey on Fault Injection Techniques.
Int. Arab J. Inf. Technol. 1(2): 171-186 (2004) |
| 2003 |
|---|
| 4 | EE | Rafic A. Ayoubi,
Haissam Ziade,
Magdy A. Bayoumi:
Fault Tolerant Hopfield Associative Memory on Torus.
DFT 2003: 369-376 |
| 3 | EE | Raoul Velazco,
Sana Rezgui,
Haissam Ziade:
Assessing the Soft Error Rate of Digital Architectures Devoted to Operate in Radiation Environment: A Case Studied.
J. Electronic Testing 19(1): 83-90 (2003) |
| 1988 |
|---|
| 2 | | C. Bellon,
Raoul Velazco,
Haissam Ziade:
Analysis of Experimental Results on Functional Testing and Diagnosis of Complex Circuits.
ITC 1988: 64-72 |
| 1985 |
|---|
| 1 | | Raoul Velazco,
Haissam Ziade,
E. Kolokithas:
A Microprocessor Test Approach Allowing Fault Localization.
ITC 1985: 737-743 |
