| |
| 2008 | ||
|---|---|---|
| 3 | EE | Yukiya Miura, Jiro Kato: Diagnosis of Analog Circuits by Using Multiple Transistors and Data Sampling. DFT 2008: 491-499 |
| 2 | EE | Yukiya Miura, Jiro Kato: Adaptive Fault Diagnosis of Analog Circuits by Operation-Region Model and X - Y Zoning Method. J. Electronic Testing 24(1-3): 223-233 (2008) |
| 2006 | ||
| 1 | EE | Yukiya Miura, Jiro Kato: Fault Diagnosis of Analog Circuits Based on Adaptive Test and Output Characteristics. DFT 2006: 410-418 |
| 1 | Yukiya Miura | [1] [2] [3] |