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Jiro Kato

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2008
3EEYukiya Miura, Jiro Kato: Diagnosis of Analog Circuits by Using Multiple Transistors and Data Sampling. DFT 2008: 491-499
2EEYukiya Miura, Jiro Kato: Adaptive Fault Diagnosis of Analog Circuits by Operation-Region Model and X - Y Zoning Method. J. Electronic Testing 24(1-3): 223-233 (2008)
2006
1EEYukiya Miura, Jiro Kato: Fault Diagnosis of Analog Circuits Based on Adaptive Test and Output Characteristics. DFT 2006: 410-418

Coauthor Index

1Yukiya Miura [1] [2] [3]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)