Shuichi Seno

List of publications from the DBLP Bibliography Server - FAQ

2002

1 EE Yukiya Miura, Shuichi Seno: Behavior Analysis of Internal Feedback Bridging Faults in CMOS Circuits. J. Electronic Testing 18(2): 109-120 (2002)

2002
1	EE	Yukiya Miura, Shuichi Seno: Behavior Analysis of Internal Feedback Bridging Faults in CMOS Circuits. J. Electronic Testing 18(2): 109-120 (2002)

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