2007 | ||
---|---|---|
2 | EE | Lei Ma, Geert Seuren, Robert Van Rijsinge, Corné Bastiaansen, Leon van der Dussen: A Design-Based Structural Test Method for a Switched-Resistor DAC. J. Electronic Testing 23(6): 559-567 (2007) |
2004 | ||
1 | EE | Bart Vermeulen, Camelia Hora, Bram Kruseman, Erik Jan Marinissen, Robert Van Rijsinge: Trends in Testing Integrated Circuits. ITC 2004: 688-697 |
1 | Corné Bastiaansen | [2] |
2 | Leon van der Dussen | [2] |
3 | Camelia Hora | [1] |
4 | Bram Kruseman | [1] |
5 | Lei Ma | [2] |
6 | Erik Jan Marinissen | [1] |
7 | Geert Seuren | [2] |
8 | Bart Vermeulen | [1] |