| |
| 1999 | ||
|---|---|---|
| 2 | Bram Kruseman, Peter Janssen, Victor Zieren: Transient current testing of 0.25 /spl mu/m CMOS devices. ITC 1999: 47-56 | |
| 1998 | ||
| 1 | EE | Manoj Sachdev, Peter Janssen, Victor Zieren: Defect detection with transient current testing and its potential for deep sub-micron CMOS ICs. ITC 1998: 204 |
| 1 | Peter Janssen | [1] [2] |
| 2 | Bram Kruseman | [2] |
| 3 | Manoj Sachdev | [1] |