Stefan van den Oetelaar

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2003

2 EE Bram Kruseman, Stefan van den Oetelaar: Detection of Resistive Shorts in Deep Sub-micron Technologies. ITC 2003: 866-875

2002

1 EE Bram Kruseman, Stefan van den Oetelaar, Josep Rius: Comparison of IDDQ Testing and Very-Low Voltage Testing. ITC 2002: 964-973

2003
2	EE	Bram Kruseman, Stefan van den Oetelaar: Detection of Resistive Shorts in Deep Sub-micron Technologies. ITC 2003: 866-875
2002
1	EE	Bram Kruseman, Stefan van den Oetelaar, Josep Rius: Comparison of IDDQ Testing and Very-Low Voltage Testing. ITC 2002: 964-973

Coauthor Index

1 Bram Kruseman [1] [2]

2 Josep Rius [1]