| |
| 2003 | ||
|---|---|---|
| 1 | EE | Ramakrishna Voorakaranam, Randy Newby, Sasikumar Cherubal, Bob Cometta, Thomas Kuehl, David M. Majernik, Abhijit Chatterjee: Production Deployment of a Fast Transient Testing Methodology for Analog Circuits : Case Study and Results. ITC 2003: 1174-1181 |
| 1 | Abhijit Chatterjee | [1] |
| 2 | Sasikumar Cherubal | [1] |
| 3 | Bob Cometta | [1] |
| 4 | David M. Majernik | [1] |
| 5 | Randy Newby | [1] |
| 6 | Ramakrishna Voorakaranam | [1] |