David M. Majernik

2004
2	EE	Sasikumar Cherubal, Ramakrishna Voorakaranam, Abhijit Chatterjee, John Mclaughlin, Jason L. Smith, David M. Majernik: Concurrent RF Test Using Optimized Modulated RF Stimuli. VLSI Design 2004: 1017-1022
2003
1	EE	Ramakrishna Voorakaranam, Randy Newby, Sasikumar Cherubal, Bob Cometta, Thomas Kuehl, David M. Majernik, Abhijit Chatterjee: Production Deployment of a Fast Transient Testing Methodology for Analog Circuits : Case Study and Results. ITC 2003: 1174-1181

Coauthor Index

1	Abhijit Chatterjee	[1] [2]
2	Sasikumar Cherubal	[1] [2]
3	Bob Cometta	[1]
4	Thomas Kuehl	[1]
5	John Mclaughlin	[2]
6	Randy Newby	[1]
7	Jason L. Smith	[2]
8	Ramakrishna Voorakaranam	[1] [2]