2003 | ||
---|---|---|
2 | EE | Ramakrishna Voorakaranam, Randy Newby, Sasikumar Cherubal, Bob Cometta, Thomas Kuehl, David M. Majernik, Abhijit Chatterjee: Production Deployment of a Fast Transient Testing Methodology for Analog Circuits : Case Study and Results. ITC 2003: 1174-1181 |
1997 | ||
1 | Bob Cometta, Jan Witte: Low Current and Low Voltages-The High-End OP AMP Testing Challenge. ITC 1997: 796-801 |
1 | Abhijit Chatterjee | [2] |
2 | Sasikumar Cherubal | [2] |
3 | Thomas Kuehl | [2] |
4 | David M. Majernik | [2] |
5 | Randy Newby | [2] |
6 | Ramakrishna Voorakaranam | [2] |
7 | Jan Witte | [1] |