| |
| 2000 | ||
|---|---|---|
| 2 | EE | Lorena Anghel, Michael Nicolaidis, Issam Alzaher-Noufal: Self-Checking Circuits versus Realistic Faults in Very Deep Submicron. VTS 2000: 55-66 |
| 1999 | ||
| 1 | EE | Issam Alzaher-Noufal, Michael Nicolaidis: A CAD Framework for Generating Self-Checking 1 Multipliers Based on Residue Codes. DATE 1999: 122- |
| 1 | Lorena Anghel | [2] |
| 2 | Michael Nicolaidis | [1] [2] |