| |
| 2000 | ||
|---|---|---|
| 4 | EE | Michael Nicolaidis, N. Zaidan, Th. Calin, D. Bied-Charreton: ISIS: A Fail-Safe Interface Realized in Smart Power Technology. IOLTW 2000: 191- |
| 1999 | ||
| 3 | EE | Th. Calin, Lorena Anghel, Michael Nicolaidis: Built-In Current Sensor for IDDQ Testing in Deep Submicron CMOS. VTS 1999: 135-142 |
| 1998 | ||
| 2 | EE | Jaime Velasco-Medina, Th. Calin, Michael Nicolaidis: Fault Detection for Linear Analog Circuits Using Current Injection. DATE 1998: 987- |
| 1995 | ||
| 1 | Th. Calin, F. L. Vargas, Michael Nicolaidis: Upset-Tolerant CMOS SRAM Using Current Monitoring: Prototype and Test Experiments. ITC 1995: 45-53 | |
| 1 | Lorena Anghel | [3] |
| 2 | D. Bied-Charreton | [4] |
| 3 | Michael Nicolaidis | [1] [2] [3] [4] |
| 4 | F. L. Vargas | [1] |
| 5 | Jaime Velasco-Medina | [2] |
| 6 | N. Zaidan | [4] |