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Ahmad A. Al-Yamani

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2009
19EECostas Argyrides, Ahmad A. Al-Yamani, Carlos Arthur Lang Lisbôa, Luigi Carro, Dhiraj K. Pradhan: Increasing memory yield in future technologies through innovative design. ISQED 2009: 622-626
2007
18EEAhmad A. Al-Yamani, Narendra Devta-Prasanna, Arun Gunda: Systematic Scan Reconfiguration. ASP-DAC 2007: 738-743
17EES. Ramsundar, Ahmad A. Al-Yamani, Dhiraj K. Pradhan: Defect Tolerance in Nanotechnology Switches Using a Greedy Reconfiguration Algorithm. ISQED 2007: 807-813
16EEAhmad A. Al-Yamani, Narendra Devta-Prasanna, Erik Chmelar, M. Grinchuk, Arun Gunda: Scan Test Cost and Power Reduction Through Systematic Scan Reconfiguration. IEEE Trans. on CAD of Integrated Circuits and Systems 26(5): 907-918 (2007)
2006
15EEAhmad A. Al-Yamani: DFT for controlled-impedance I/O buffers. DAC 2006: 405-410
2005
14EEAhmad A. Al-Yamani, Narendra Devta-Prasanna, Arun Gunda: Should Illinois-Scan Based Architectures be Centralized or Distributed? DFT 2005: 406-414
13EEAhmad A. Al-Yamani, Edward J. McCluskey: BIST-Guided ATPG. ISQED 2005: 244-249
12EEIntaik Park, Ahmad A. Al-Yamani, Edward J. McCluskey: Effective TARO Pattern Generation. VTS 2005: 161-166
11EEAhmad A. Al-Yamani, Erik Chmelar, Mikhail Grinchuck: Segmented Addressable Scan Architecture. VTS 2005: 405-411
10EEAhmad A. Al-Yamani, Edward J. McCluskey: Test chip experimental results on high-level structural test. ACM Trans. Design Autom. Electr. Syst. 10(4): 690-701 (2005)
9EEAhmad A. Al-Yamani, Subhasish Mitra, Edward J. McCluskey: Optimized reseeding by seed ordering and encoding. IEEE Trans. on CAD of Integrated Circuits and Systems 24(2): 264-270 (2005)
2004
8EEEdward J. McCluskey, Ahmad A. Al-Yamani, Chien-Mo James Li, Chao-Wen Tseng, Erik H. Volkerink, François-Fabien Ferhani, Edward Li, Subhasish Mitra: ELF-Murphy Data on Defects and Test Sets. VTS 2004: 16-22
2003
7EEAhmad A. Al-Yamani, Edward J. McCluskey: Seed encoding with LFSRs and cellular automata. DAC 2003: 560-565
6EEAhmad A. Al-Yamani, Sadiq M. Sait, Hassan Barada, Habib Youssef: Parallel Tabu Search in a Heterogeneous Environment. IPDPS 2003: 56
5EEAhmad A. Al-Yamani, Edward J. McCluskey: Built-In Reseeding for Serial Bist. VTS 2003: 63-68
4EEAhmad A. Al-Yamani, Subhasish Mitra, Edward J. McCluskey: Bist Reseeding with very few Seeds. VTS 2003: 69-76
2002
3EEAhmad A. Al-Yamani, Subhasish Mitra, Edward J. McCluskey: Testing Digital Circuits with Constraints. DFT 2002: 195-206
2 Ahmad A. Al-Yamani, Sadiq M. Sait, Habib Youssef, Hassan Barada: Parallelizing Tabu Search on a Cluster of Heterogeneous Workstations. J. Heuristics 8(3): 277-304 (2002)
2001
1EEAhmad A. Al-Yamani, Nahmsuk Oh, Edward J. McCluskey: Performance Evaluation of Checksum-Based ABFT. DFT 2001: 461-

Coauthor Index

1Costas Argyrides [19]
2Hassan Barada [2] [6]
3Luigi Carro [19]
4Erik Chmelar [11] [16]
5Narendra Devta-Prasanna [14] [16] [18]
6François-Fabien Ferhani [8]
7Mikhail Grinchuck [11]
8M. Grinchuk [16]
9Arun Gunda [14] [16] [18]
10Chien-Mo James Li (James Chien-Mo Li) [8]
11Edward Li [8]
12Carlos Arthur Lang Lisbôa [19]
13Edward J. McCluskey [1] [3] [4] [5] [7] [8] [9] [10] [12] [13]
14Subhasish Mitra [3] [4] [8] [9]
15Nahmsuk Oh [1]
16Intaik Park [12]
17Dhiraj K. Pradhan [17] [19]
18S. Ramsundar [17]
19Sadiq M. Sait [2] [6]
20Chao-Wen Tseng [8]
21Erik H. Volkerink [8]
22Habib Youssef [2] [6]

Colors in the list of coauthors

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)