2009 |
19 | EE | Costas Argyrides,
Ahmad A. Al-Yamani,
Carlos Arthur Lang Lisbôa,
Luigi Carro,
Dhiraj K. Pradhan:
Increasing memory yield in future technologies through innovative design.
ISQED 2009: 622-626 |
2007 |
18 | EE | Ahmad A. Al-Yamani,
Narendra Devta-Prasanna,
Arun Gunda:
Systematic Scan Reconfiguration.
ASP-DAC 2007: 738-743 |
17 | EE | S. Ramsundar,
Ahmad A. Al-Yamani,
Dhiraj K. Pradhan:
Defect Tolerance in Nanotechnology Switches Using a Greedy Reconfiguration Algorithm.
ISQED 2007: 807-813 |
16 | EE | Ahmad A. Al-Yamani,
Narendra Devta-Prasanna,
Erik Chmelar,
M. Grinchuk,
Arun Gunda:
Scan Test Cost and Power Reduction Through Systematic Scan Reconfiguration.
IEEE Trans. on CAD of Integrated Circuits and Systems 26(5): 907-918 (2007) |
2006 |
15 | EE | Ahmad A. Al-Yamani:
DFT for controlled-impedance I/O buffers.
DAC 2006: 405-410 |
2005 |
14 | EE | Ahmad A. Al-Yamani,
Narendra Devta-Prasanna,
Arun Gunda:
Should Illinois-Scan Based Architectures be Centralized or Distributed?
DFT 2005: 406-414 |
13 | EE | Ahmad A. Al-Yamani,
Edward J. McCluskey:
BIST-Guided ATPG.
ISQED 2005: 244-249 |
12 | EE | Intaik Park,
Ahmad A. Al-Yamani,
Edward J. McCluskey:
Effective TARO Pattern Generation.
VTS 2005: 161-166 |
11 | EE | Ahmad A. Al-Yamani,
Erik Chmelar,
Mikhail Grinchuck:
Segmented Addressable Scan Architecture.
VTS 2005: 405-411 |
10 | EE | Ahmad A. Al-Yamani,
Edward J. McCluskey:
Test chip experimental results on high-level structural test.
ACM Trans. Design Autom. Electr. Syst. 10(4): 690-701 (2005) |
9 | EE | Ahmad A. Al-Yamani,
Subhasish Mitra,
Edward J. McCluskey:
Optimized reseeding by seed ordering and encoding.
IEEE Trans. on CAD of Integrated Circuits and Systems 24(2): 264-270 (2005) |
2004 |
8 | EE | Edward J. McCluskey,
Ahmad A. Al-Yamani,
Chien-Mo James Li,
Chao-Wen Tseng,
Erik H. Volkerink,
François-Fabien Ferhani,
Edward Li,
Subhasish Mitra:
ELF-Murphy Data on Defects and Test Sets.
VTS 2004: 16-22 |
2003 |
7 | EE | Ahmad A. Al-Yamani,
Edward J. McCluskey:
Seed encoding with LFSRs and cellular automata.
DAC 2003: 560-565 |
6 | EE | Ahmad A. Al-Yamani,
Sadiq M. Sait,
Hassan Barada,
Habib Youssef:
Parallel Tabu Search in a Heterogeneous Environment.
IPDPS 2003: 56 |
5 | EE | Ahmad A. Al-Yamani,
Edward J. McCluskey:
Built-In Reseeding for Serial Bist.
VTS 2003: 63-68 |
4 | EE | Ahmad A. Al-Yamani,
Subhasish Mitra,
Edward J. McCluskey:
Bist Reseeding with very few Seeds.
VTS 2003: 69-76 |
2002 |
3 | EE | Ahmad A. Al-Yamani,
Subhasish Mitra,
Edward J. McCluskey:
Testing Digital Circuits with Constraints.
DFT 2002: 195-206 |
2 | | Ahmad A. Al-Yamani,
Sadiq M. Sait,
Habib Youssef,
Hassan Barada:
Parallelizing Tabu Search on a Cluster of Heterogeneous Workstations.
J. Heuristics 8(3): 277-304 (2002) |
2001 |
1 | EE | Ahmad A. Al-Yamani,
Nahmsuk Oh,
Edward J. McCluskey:
Performance Evaluation of Checksum-Based ABFT.
DFT 2001: 461- |