| |
| 2004 | ||
|---|---|---|
| 1 | EE | Edward J. McCluskey, Ahmad A. Al-Yamani, Chien-Mo James Li, Chao-Wen Tseng, Erik H. Volkerink, François-Fabien Ferhani, Edward Li, Subhasish Mitra: ELF-Murphy Data on Defects and Test Sets. VTS 2004: 16-22 |
| 1 | Ahmad A. Al-Yamani | [1] |
| 2 | François-Fabien Ferhani | [1] |
| 3 | Chien-Mo James Li (James Chien-Mo Li) | [1] |
| 4 | Edward J. McCluskey | [1] |
| 5 | Subhasish Mitra | [1] |
| 6 | Chao-Wen Tseng | [1] |
| 7 | Erik H. Volkerink | [1] |