2008 |
4 | EE | Jaekwang Lee,
Intaik Park,
Edward J. McCluskey:
Error Sequence Analysis.
VTS 2008: 255-260 |
3 | EE | Intaik Park,
Donghwi Lee,
Erik Chmelar,
Edward J. McCluskey:
Inconsistent Fail due to Limited Tester Timing Accuracy.
VTS 2008: 47-52 |
2007 |
2 | EE | Donghwi Lee,
Erik H. Volkerink,
Intaik Park,
Jeff Rearick:
Empirical Validation of Yield Recovery Using Idle-Cycle Insertion.
IEEE Design & Test of Computers 24(4): 362-372 (2007) |
2005 |
1 | EE | Intaik Park,
Ahmad A. Al-Yamani,
Edward J. McCluskey:
Effective TARO Pattern Generation.
VTS 2005: 161-166 |