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E. Vincent

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2008
17EEPierre Leveau, E. Vincent, G. Richard, Laurent Daudet: Instrument-Specific Harmonic Atoms for Mid-Level Music Representation. IEEE Transactions on Audio, Speech & Language Processing 16(1): 116-128 (2008)
2007
16EEE. Vincent, M. D. Plumbley: Low Bit-Rate Object Coding of Musical Audio Using Bayesian Harmonic Models. IEEE Transactions on Audio, Speech & Language Processing 15(4): 1273-1282 (2007)
2006
15EEC. R. Parthasarathy, M. Denais, V. Huard, G. Ribes, D. Roy, C. Guérin, F. Perrier, E. Vincent, A. Bravaix: Designing in reliability in advanced CMOS technologies. Microelectronics Reliability 46(9-11): 1464-1471 (2006)
2005
14EEV. Huard, M. Denais, F. Perrier, N. Revil, C. R. Parthasarathy, A. Bravaix, E. Vincent: A thorough investigation of MOSFETs NBTI degradation. Microelectronics Reliability 45(1): 83-98 (2005)
13EEA. Bravaix, D. Goguenheim, M. Denais, V. Huard, C. R. Parthasarathy, F. Perrier, N. Revil, E. Vincent: Impacts of the recovery phenomena on the worst-case of damage in DC/AC stressed ultra-thin NO gate-oxide MOSFETs. Microelectronics Reliability 45(9-11): 1370-1375 (2005)
2004
12EEA. Bravaix, D. Goguenheim, N. Revil, E. Vincent: Hole injection enhanced hot-carrier degradation in PMOSFETs used for systems on chip applications with 6.5-2 nm thick gate-oxides. Microelectronics Reliability 44(1): 65-77 (2004)
2003
11EEG. Ghibaudo, E. Vincent: Guest Editorial. Microelectronics Reliability 43(8): 1173 (2003)
10EEF. Monsieur, E. Vincent, V. Huard, S. Bruyère, D. Roy, Thomas Skotnicki, G. Pananakakis, G. Ghibaudo: On the role of holes in oxide breakdown mechanism in inverted nMOSFETs. Microelectronics Reliability 43(8): 1199-1202 (2003)
9EEC. Besset, S. Bruyère, S. Blonkowski, S. Crémer, E. Vincent: MIM capacitance variation under electrical stress. Microelectronics Reliability 43(8): 1237-1240 (2003)
8EEA. Bravaix, C. Trapes, D. Goguenheim, N. Revil, E. Vincent: Carrier injection efficiency for the reliability study of 3.5-1.2 nm thick gate-oxide CMOS technologies. Microelectronics Reliability 43(8): 1241-1246 (2003)
2002
7EED. Roy, S. Bruyère, E. Vincent, F. Monsieur: Series resistance and oxide thickness spread influence on Weibull breakdown distribution: New experimental correction for reliability projection improvement. Microelectronics Reliability 42(9-11): 1497-1500 (2002)
6EEF. Monsieur, E. Vincent, D. Roy, S. Bruyère, G. Pananakakis, G. Ghibaudo: Gate oxide Reliability assessment optimization. Microelectronics Reliability 42(9-11): 1505-1508 (2002)
2001
5EES. Bruyère, D. Roy, E. Robilliart, E. Vincent, G. Ghibaudo: Body effect induced wear-out acceleration in ultra-thin oxides. Microelectronics Reliability 41(7): 1031-1034 (2001)
4EEF. Monsieur, E. Vincent, G. Pananakakis, G. Ghibaudo: Wear-out, breakdown occurrence and failure detection in 18-25 Å ultrathin oxides. Microelectronics Reliability 41(7): 1035-1039 (2001)
3 F. Monsieur, E. Vincent, D. Roy, S. Bruyère, G. Pananakakis, G. Ghibaudo: Determination of Dielectric Breakdown Weibull Distribution Parameters Confidence Bounds for Accurate Ultrathin Oxide Reliability Predictions. Microelectronics Reliability 41(9-10): 1295-1300 (2001)
2 A. Bravaix, D. Goguenheim, N. Revil, E. Vincent: Injection Mechanisms and Lifetime Prediction with the Substrate Voltage in 0.15mum Channel-Length N-MOSFETs. Microelectronics Reliability 41(9-10): 1313-1318 (2001)
1 S. Bruyère, F. Monsieur, D. Roy, E. Vincent, G. Ghibaudo: Failures in ultrathin oxides: Stored energy or carrier energy driven? Microelectronics Reliability 41(9-10): 1367-1372 (2001)

Coauthor Index

1C. Besset [9]
2S. Blonkowski [9]
3A. Bravaix [2] [8] [12] [13] [14] [15]
4S. Bruyère [1] [3] [5] [6] [7] [9] [10]
5S. Crémer [9]
6Laurent Daudet [17]
7M. Denais [13] [14] [15]
8G. Ghibaudo [1] [3] [4] [5] [6] [10] [11]
9D. Goguenheim [2] [8] [12] [13]
10C. Guérin [15]
11V. Huard [10] [13] [14] [15]
12Pierre Leveau [17]
13F. Monsieur [1] [3] [4] [6] [7] [10]
14G. Pananakakis [3] [4] [6] [10]
15C. R. Parthasarathy [13] [14] [15]
16F. Perrier [13] [14] [15]
17M. D. Plumbley [16]
18N. Revil [2] [8] [12] [13] [14]
19G. Ribes [15]
20G. Richard [17]
21E. Robilliart [5]
22D. Roy [1] [3] [5] [6] [7] [10] [15]
23Thomas Skotnicki [10]
24C. Trapes [8]

Colors in the list of coauthors

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)