| |
| 2001 | ||
|---|---|---|
| 1 | EE | S. Bruyère, D. Roy, E. Robilliart, E. Vincent, G. Ghibaudo: Body effect induced wear-out acceleration in ultra-thin oxides. Microelectronics Reliability 41(7): 1031-1034 (2001) |
| 1 | S. Bruyère | [1] |
| 2 | G. Ghibaudo | [1] |
| 3 | D. Roy | [1] |
| 4 | E. Vincent | [1] |