2005 | ||
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2 | EE | E. Deloffre, L. Montès, G. Ghibaudo, S. Bruyère, S. Blonkowski, S. Bécu, M. Gros-Jean, S. Crémer: Electrical properties in low temperature range (5K-300K) of Tantalum Oxide dielectric MIM capacitors. Microelectronics Reliability 45(5-6): 925-928 (2005) |
2003 | ||
1 | EE | C. Besset, S. Bruyère, S. Blonkowski, S. Crémer, E. Vincent: MIM capacitance variation under electrical stress. Microelectronics Reliability 43(8): 1237-1240 (2003) |
1 | S. Bécu | [2] |
2 | C. Besset | [1] |
3 | S. Blonkowski | [1] [2] |
4 | S. Bruyère | [1] [2] |
5 | E. Deloffre | [2] |
6 | G. Ghibaudo | [2] |
7 | M. Gros-Jean | [2] |
8 | L. Montès | [2] |
9 | E. Vincent | [1] |