| |
| 2005 | ||
|---|---|---|
| 2 | EE | C. Trapes, D. Goguenheim, A. Bravaix: Experimental extraction of degradation parameters after constant voltage stress and substrate hot electron injection on ultrathin oxides. Microelectronics Reliability 45(5-6): 883-886 (2005) |
| 2003 | ||
| 1 | EE | A. Bravaix, C. Trapes, D. Goguenheim, N. Revil, E. Vincent: Carrier injection efficiency for the reliability study of 3.5-1.2 nm thick gate-oxide CMOS technologies. Microelectronics Reliability 43(8): 1241-1246 (2003) |
| 1 | A. Bravaix | [1] [2] |
| 2 | D. Goguenheim | [1] [2] |
| 3 | N. Revil | [1] |
| 4 | E. Vincent | [1] |