C. Besset

2003
1	EE	C. Besset, S. Bruyère, S. Blonkowski, S. Crémer, E. Vincent: MIM capacitance variation under electrical stress. Microelectronics Reliability 43(8): 1237-1240 (2003)

Coauthor Index

1	S. Blonkowski	[1]
2	S. Bruyère	[1]
3	S. Crémer	[1]
4	E. Vincent	[1]