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1999 | ||
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1 | EE | A. Toulouse, David Bernard, Christian Landrault, Pascal Nouet: Efficient 3D Modelling for Extraction of Interconnect Capacitances in Deep Submicron Dense Layouts. DATE 1999: 576-580 |
1 | David Bernard | [1] |
2 | Christian Landrault | [1] |
3 | Pascal Nouet | [1] |