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A. Toulouse

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1999
1EEA. Toulouse, David Bernard, Christian Landrault, Pascal Nouet: Efficient 3D Modelling for Extraction of Interconnect Capacitances in Deep Submicron Dense Layouts. DATE 1999: 576-580

Coauthor Index

1David Bernard [1]
2Christian Landrault [1]
3Pascal Nouet [1]

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