| 2005 |
|---|
| 5 | EE | D. Veyrié,
D. Lellouchi,
J.-L. Roux,
F. Pressecq,
A. Tetelin,
C. Pellet:
FTIR spectroscopy for the hermeticity assessment of micro-cavities.
Microelectronics Reliability 45(9-11): 1764-1769 (2005) |
| 4 | EE | Q.-H. Duong,
L. Buchaillot,
D. Collard,
P. Schmitt,
X. Lafontan,
P. Pons,
F. Flourens,
F. Pressecq:
Thermal and electrostatic reliability characterization in RF MEMS switches.
Microelectronics Reliability 45(9-11): 1790-1793 (2005) |
| 2003 |
|---|
| 3 | EE | X. Lafontan,
F. Pressecq,
Felix Beaudoin,
S. Rigo,
M. Dardalhon,
J.-L. Roux,
P. Schmitt,
J. Kuchenbecker,
B. Baradat,
D. Lellouchi:
The advent of MEMS in space.
Microelectronics Reliability 43(7): 1061-1083 (2003) |
| 2001 |
|---|
| 2 | | Vincent Beroulle,
Laurent Latorre,
M. Dardalhon,
C. Oudea,
G. Perez,
F. Pressecq,
Pascal Nouet:
Impact of Technology Spreading on MEMS design Robustness.
VLSI-SOC 2001: 241-251 |
| 1999 |
|---|
| 1 | EE | Laurent Latorre,
Yves Bertrand,
P. Hazard,
F. Pressecq,
Pascal Nouet:
Design, Characterization & Modelling of a CMOS Magnetic Field Sensor.
DATE 1999: 239-243 |
