| 2009 |
|---|
| 5 | EE | Nilanjan Mukherjee,
Artur Pogiel,
Janusz Rajski,
Jerzy Tyszer:
High-Speed On-Chip Event Counters for Embedded Systems.
VLSI Design 2009: 275-280 |
| 2007 |
|---|
| 4 | EE | Grzegorz Mrugalski,
Artur Pogiel,
Janusz Rajski,
Jerzy Tyszer:
Fault Diagnosis With Convolutional Compactors.
IEEE Trans. on CAD of Integrated Circuits and Systems 26(8): 1478-1494 (2007) |
| 3 | EE | Grzegorz Mrugalski,
Janusz Rajski,
Chen Wang,
Artur Pogiel,
Jerzy Tyszer:
Isolation of Failing Scan Cells through Convolutional Test Response Compaction.
J. Electronic Testing 23(1): 35-45 (2007) |
| 2006 |
|---|
| 2 | EE | Artur Pogiel,
Janusz Rajski,
Jerzy Tyszer:
Convolutional Compactors with Variable Polynomials.
European Test Symposium 2006: 117-122 |
| 2004 |
|---|
| 1 | EE | Grzegorz Mrugalski,
Chen Wang,
Artur Pogiel,
Jerzy Tyszer,
Janusz Rajski:
Fault Diagnosis in Designs with Convolutional Compactors.
ITC 2004: 498-507 |
