| |
| 2003 | ||
|---|---|---|
| 1 | EE | Hideyuki Ichihara, Kozo Kinoshita, Koji Isodono, Shigeki Nishikawa: Channel Width Test Data Compression under a Limited Number of Test Inputs and Outputs. VLSI Design 2003: 329-334 |
| 1 | Hideyuki Ichihara | [1] |
| 2 | Kozo Kinoshita | [1] |
| 3 | Shigeki Nishikawa | [1] |