| |
| 2007 | ||
|---|---|---|
| 1 | EE | Ahmad A. Al-Yamani, Narendra Devta-Prasanna, Erik Chmelar, M. Grinchuk, Arun Gunda: Scan Test Cost and Power Reduction Through Systematic Scan Reconfiguration. IEEE Trans. on CAD of Integrated Circuits and Systems 26(5): 907-918 (2007) |
| 1 | Ahmad A. Al-Yamani | [1] |
| 2 | Erik Chmelar | [1] |
| 3 | Narendra Devta-Prasanna | [1] |
| 4 | Arun Gunda | [1] |