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Bing Qiu

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2003
2EEMeng Lu, Yvon Savaria, Bing Qiu, Jacques Taillefer: IEEE 1149.1 Based Defect and Fault Tolerant Scan Chain for Wafer Scale Integration. DFT 2003: 18-25
2002
1EEBing Qiu, Yvon Savaria, Meng Lu, Chunyan Wang, Claude Thibeault: Yield Modeling of a WSI Telecom Router Architecture. DFT 2002: 314-324

Coauthor Index

1Meng Lu [1] [2]
2Yvon Savaria [1] [2]
3Jacques Taillefer [2]
4Claude Thibeault [1]
5Chunyan Wang [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)