| |
| 2003 | ||
|---|---|---|
| 2 | EE | Meng Lu, Yvon Savaria, Bing Qiu, Jacques Taillefer: IEEE 1149.1 Based Defect and Fault Tolerant Scan Chain for Wafer Scale Integration. DFT 2003: 18-25 |
| 2002 | ||
| 1 | EE | Bing Qiu, Yvon Savaria, Meng Lu, Chunyan Wang, Claude Thibeault: Yield Modeling of a WSI Telecom Router Architecture. DFT 2002: 314-324 |
| 1 | Meng Lu | [1] [2] |
| 2 | Yvon Savaria | [1] [2] |
| 3 | Jacques Taillefer | [2] |
| 4 | Claude Thibeault | [1] |
| 5 | Chunyan Wang | [1] |